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Mots clés
27Alda
Alloys
AFM
Low energy electron diffraction LEED
27Ald p&α
Auger electron spectroscopy AES
ALD
18O resonance
HfO2
17Opp
Thin film
Zinc oxide
Oxygen deficiency
Magnetic semiconductors
RBS
Photoluminescence
Periodic multilayer
Aluminium
Adsorption
Ion beam analysis
Al2O3
Acoustic
Epitaxial growth
Topological insulators
Kossel diffraction
Isotopic Tracing
Multilayer
15N
Nickel
Energy loss
Thin films
Nitridation
Sputtering
Nanostructures
Growth
Nanoparticles
Silicon carbide
Defects
Channeling
Gold
Raman spectroscopy
Ion implantation
7630Lh
Silicon Carbide
Magnetic anisotropy
13C
Evaluation
3C-SiC
EPR
Atomic Layer Deposition ALD
Transparent conductive oxide TCO
XPS
7550Pp
Ageing
Adsorption Isotherms
6855Jk
7550Ee
Nuclear resonance profiling NRP
17O
Magnetization curves
Indium oxide
2H
X-ray diffraction
PIXE
Hysteresis
Stable isotopic tracing
18O
GaMnAs
NRP
Capillary condensation
Pulsed laser deposition
XRD
Ferromagnetic resonance
ADSORPTION DESORPTION HYSTERESIS
Metal-insulator transition
Silicon
Pb centers
Topological defects
Adsorbed layers
Passivation
Annealing
17Op
SiC
Aluminum
Silica
Charge exchange
27Aldp
Density functional theory
Acoustic propreties of solid
Alloy
Measurement
8140Ef
Oxidation
Gallium oxide
Interface defects
Nuclear reaction analysis
Epitaxy
Rutherford backscattering spectrometry RBS
AC susceptibility
Diffusion